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Material Characterization Products

Hazardous metals analyzer - EDXRF X-RoHS with Silicon Drift Detection (SDD)

Hazardous metals analyzer - EDXRF X-RoHS with Silicon Drift Detection (SDD)

Xenemetrix | Material Characterization, Spectroscopy, Chemical Identification

The X-RoHS with Silicon drift detection is a benchtop analyzer ideally suited for RoHS/WEEE compliance testing and screening of regulated elements (Pb, Hg, Cd, Cr, Br). It is widely used in Petrochemical, Polymers, Metallurgical, Environmen…

SZ 100 Nanoparticle/Zeta Potential Analyzer

SZ 100 Nanoparticle/Zeta Potential Analyzer

HORIBA | Material Characterization, Particle Size Analysis

The SZ-100 nanopartical series instruments are flexible analytical tools for characterizing the physical properties of small particles. Depending on the configuration and application the system can be used as a particle size analyzer, or al…