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Hazardous metals analyzer - EDXRF X-RoHS with Silicon Drift Detection (SDD)

Hazardous metals analyzer - EDXRF X-RoHS with Silicon Drift Detection (SDD)

Xenemetrix | Material Characterization, Spectroscopy, Chemical Identification

The X-RoHS with Silicon drift detection is a benchtop analyzer ideally suited for RoHS/WEEE compliance testing and screening of regulated elements (Pb, Hg, Cd, Cr, Br). It is widely used in Petrochemical, Polymers, Metallurgical, Environmental, Minerals, Receptest

This analyzer offers fast quantitative metals analysis and allows manufacturers to comply with regulations and  select optimal acquisition parameters for samples of various matrices, thicknesses, and sizes. The X-RoHS+SDD fully complies with the latest RoHS 2 2011/65/EU directive and is ready for future regulation updates and upgrades.

Key Features:

  • Accurately analyze restricted elements in no time!
  • Integrated camera and micro X-Ray spot for full identification of the area of interest.
  • Automatic matrix identification allows operation of non-technical personnel with high degree of confidence.
  • Intuitive and user-friendly proprietary software.

Robust design.

 

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