Hazardous metals analyzer - EDXRF X-RoHS with Silicon Drift Detection (SDD)
The X-RoHS with Silicon drift detection is a benchtop analyzer ideally suited for RoHS/WEEE compliance testing and screening of regulated elements (Pb, Hg, Cd, Cr, Br). It is widely used in Petrochemical, Polymers, Metallurgical, Environmental, Minerals, Receptest
This analyzer offers fast quantitative metals analysis and allows manufacturers to comply with regulations and select optimal acquisition parameters for samples of various matrices, thicknesses, and sizes. The X-RoHS+SDD fully complies with the latest RoHS 2 2011/65/EU directive and is ready for future regulation updates and upgrades.
- Accurately analyze restricted elements in no time!
- Integrated camera and micro X-Ray spot for full identification of the area of interest.
- Automatic matrix identification allows operation of non-technical personnel with high degree of confidence.
- Intuitive and user-friendly proprietary software.