Nanotrac Flex Nanoparticle Size Analyzer

The Nanotrac Flex In-Situ Particle Size Analyzer Delivers Fast and Accurate Analysis Capability

Powered by Microtrac MRB’s enhanced dynamic light scattering technology, the Nanotrac Flex is ideal for measuring particles across wide concentration ranges, using minimal sample volume. Named appropriately, the external probe grants the flexibility to measure suspensions from sub-nanometer to several microns, in-situ or on a lab bench.

Based on 180° heterodyne dynamic light scattering the Nanotrac Flex can measure up to 40% w/v material concentration (sample-dependent). With this setup, a part of the laser beam is added to the scattered light, which works like an optical enhancement. In addition to particle size, the molecular weight (according to Debye) can also be measured without having to add the needed dn/dc value manually. The dip-in probe enables direct measurement via in-situ analysis. Advantages of this are that no cuvettes are needed, the direct measurement in the product and the in-situ option. The results are ready after a measurement time of 10 to 100 seconds, with parameters like refractive index, particle absorption and viscosity being available in a database. By utilizing the proprietary Mie-calculation, the user is able to measure transparent or light-absorbing samples as well as spherical, non-spherical and irregular particles.

The probe as the catalyst for Microtrac MRB’s Reference Beating, an enhancement to traditional DLS, increases the optical signal back to the detector anywhere from 100 to 1,000,000 times more than systems that use “self-beating.” The enhanced signal produces superior analysis results when measuring single modes or multi-modes across the widest concentration range.